WAFER PROBING EQUIPMENT

Wafer Probing Equipment

Wafer Probing Equipment

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Device Characterization at the Semiconductor Wafer Level






Video Copyright© Compound Semiconductor Applications (CSA) Catapult

The video explains benefits such as improving the yield Semiconductor 300mm Probe Station of devices & optimising wafer level growth when characterising semiconductor devices at the wafer Semiconductor 300mm Probe Station level.

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